Incoming-Outgoing Devices
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Incoming-Outgoing Devices
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Message ID:
31
Entry time:
Thu Nov 28 11:11:16 2019
Author:
Cristina
Category:
test with bakeout
Subject:
Reference chamber for Monitor for beam diagnostic
Expected:
Current Status:
New Expected Date:
Date Received:
09.01.2020
Status:
on-going
Visual Inspection:
Not Needed
Test Started:
08.01.2020; 09:05 am; repeat due to leak - 13.01.2019, 07:00 am
Setup:
Setup 2
Test Ended:
Result:
Outgoing Date:
Taken by:
ELOG V3.1.5-fc6679b