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| Dielectronic recombination-assisted laser spectroscopy |
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Message ID: 84
Entry time: Mon May 30 00:56:33 2022
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| Author: |
Max, Patrick |
| Category: |
Laser |
| Subject: |
Beam overlap |
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The ion beam positions are (+- 1mm):
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device | move in dir. | scratch (mm) | gone (mm) | gone +- 4.5 (mm) | x0 (mm)
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GECEDS1VU | up | -1.5 | 0.7 | 5.2 |
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GECEDS1HA | right | -26 | -22 | -17.5 | -4.7
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| left | -10.0 | -13.0 | -17.5 |
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GECEDS2VU | up | -2.0 | 0.0 | 4.5 |
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GECEDS2HA | right | -22.0 | -18.5 | -14.0 | 3.1
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| left | -6.0 | -9.5 | -14.0 |
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Notes:
- In between a measurement the scrapers stopped working in the device control. Therefore, we had to go into the electronics room.
- Position to scratch charge transferred beam: S1HA at -35.
- Beam diameter is roughly 6-7 mm (horizontally) and 4 mm vertically (as opposed to 1-2 mm).
- The charge transferred ion beam seems to shift the position of the main beam over time (1cm / 2h) as the main beam "transfers its intensity".
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